Professional Background

• Quality Leader, GE Global Research, Niskayuna, NY, 2012-2016
• Quality Manager, Motorola, Libertyville, IL, 2005-2011
• Principal Staff Engineer, Motorola, Schaumburg, IL, 1999-2005

Education

• Ph.D. (Applied Mechanics), Northwestern University, Evanston, IL
• M.S. (Mechanical Engineering), Illinois Institute of Technology, Chicago, IL 
• B.S. (Mechanical Engineering), Belarus Polytechnic Institute, Minsk, Belarus

Certifications

• Six Sigma Black Belt, Motorola, Schaumburg, IL
• PMP, Project Management Institute, Newtown, PA
• Masters in Project Management, George Washington University, Washington, DC 
• Lead Auditor, ISO 9001:2000 & ISO 9001:2008

Responsibilities

Dr. Stolkarts manages quality programs, policies and initiatives at SUNY POLY CNSE location. Vlad provides quality management leadership to a team of engineers, technicians and managers and is responsible for the development of a quality management system for advanced technology programs compliant with ISO 9001. Dr. Stolkarts is CNSE management representative for quality and is responsible for meeting customers’ and other interested parties’ requirements. Along with these activities Vlad is responsible for management reviews, customer quality assurance, supplier quality management, document control, change management, corrective and preventive actions, and overseeing day to day operation of the Quality programs for SiC and Photonics devices. 

Selected Publications

V. Stolkarts, L.M. Keer, M.E. Fine, “Constitutive and Cyclic Damage Model of 63Sn37Pb Solder”, Journal of Electronic Packaging, Dec 2001

V. Stolkarts, L.M. Keer, M.E. Fine, “Damage Evolution Governed by Microcrack Nucleation with Application to the Fatigue of 63Sn-37Pb Solder”, Journal of the Mechanics and Physics of Solids, Dec 1999

M.E. Fine, V. Stolkarts, L.M. Keer, “Fatigue Crack Nucleation Assisted by Thermal Activation”, Materials Science and Engineering A, Nov 1999